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 | | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Patrick Echlin, Dale E. Newbury, David C. Joy, Charles Fiori, Eric Lifshin Paperback, 673 Pages, Published 2014 by Springer ISBN-13: 978-1-4613-3275-6, ISBN: 1-4613-3275-3 |
 | | Helium Ion Microscopy Principles and Applications (SpringerBriefs in Materials) by David C. Joy Paperback, 64 Pages, Published 2013 by Springer ISBN-13: 978-1-4614-8659-6, ISBN: 1-4614-8659-9 |
 | | Scanning Electron Microscopy and X-Ray Microanalysis(4th Edition) by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, David C. Joy, John Henry Scott Hardcover, 550 Pages, Published 2017 by Springer ISBN-13: 978-1-4939-6674-5, ISBN: 1-4939-6674-X |
 | | Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin, David C. Joy, Dale E. Newbury, Joseph I. Goldstein, Charles E. Fiori Hardcover, 454 Pages, Published 1986 by Plenum Press ISBN-13: 978-0-306-42140-2, ISBN: 0-306-42140-2 |
 | | Scanning Electron Microscopy and X-ray Microanalysis(3rd Edition) Third Edition by Joseph Goldstein, David C. Joy, Dale E. Newbury, Patrick Echlin, Charles E., Eric Lifshin, J.R. Michael, Linda C. Sawyer, Dale E. Paperback, 689 Pages, Published 2013 by Springer ISBN-13: 978-1-4613-4969-3, ISBN: 1-4613-4969-9 |
 | | Introduction to Electron Holography by Edgar Vã Lkl, Lawrence F. Allard, David C. Joy, Edgar Völkl Paperback, 354 Pages, Published 2012 by Springer ISBN-13: 978-1-4613-7183-0, ISBN: 1-4613-7183-X |
 | | Scanning Electron Microscopy and X-Ray Microanalysis(2nd Edition) A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Patrick Echlin, Dale E. Newbury, David C. Joy, Charles Fiori, Eric Lifshin Hardcover, 673 Pages, Published 1981 by Springer ISBN-13: 978-0-306-40768-0, ISBN: 0-306-40768-X |
 | | Monte Carlo Modeling for Electron Microscopy and Microanalysis (Monte Carlo Modelling for Electron Microscopy & Microanalysi) by David C. Joy Hardcover, 224 Pages, Published 1995 by Oxford University Press ISBN-13: 978-0-19-508874-8, ISBN: 0-19-508874-3 |
 | | Advanced Scanning Electron Microscopy and X-Ray Microanalysis(Reprint) by Patrick Echlin, Joseph I. Goldstein, Charles E. Fiori, Dale E. Newbury, David C. Joy Paperback, 454 Pages, Published 2013 by Springer ISBN-13: 978-1-4757-9029-0, ISBN: 1-4757-9029-5 |
 | | Scanning Electron Microscopy and X-ray Microanalysis(3rd Edition) Third Edition by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael, Joseph Michael, L.C. Sawyer Hardcover, 690 Pages, Published 2007 by Springer ISBN-13: 978-0-306-47292-3, ISBN: 0-306-47292-9 |
 | | Scanning Electron Microscopy and X-Ray Microanalysis by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, David C. Joy 550 Pages, Published 2017 by Springer ISBN-13: 978-1-4939-6676-9, ISBN: 1-4939-6676-6 |
 | | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists by Joseph Goldstein, David C. Joy, Patrick Echlin, Dale E. Newbury, Charles Fiori, Eric Lifshin 673 Pages, Published 2013 by Springer Science & Business Media ISBN-13: 978-1-4613-3273-2, ISBN: 1-4613-3273-7 |
 | | Principles of Analytical Electron Microscopy by Joseph Goldstein, David C. Joy 448 Pages, Published 2013 by Springer Science & Business Media ISBN-13: 978-1-4899-2037-9, ISBN: 1-4899-2037-4 |
 | | SpringerBriefs in Materials Helium Ion Microscopy : Principles and Applications by David C. Joy 64 Pages, Published 2013 by Springer Science & Business Media ISBN-13: 978-1-4614-8660-2, ISBN: 1-4614-8660-2 |
 | | Introduction to Electron Holography by Edgar Völkl, Lawrence F. Allard, David C. Joy 354 Pages, Published 2013 by Springer Science & Business Media ISBN-13: 978-1-4615-4817-1, ISBN: 1-4615-4817-9 |
 | | Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein, David C. Joy, Patrick Echlin, Dale E. Newbury, C. E. Fiori 454 Pages, Published 2013 by Springer Science & Business Media ISBN-13: 978-1-4757-9027-6, ISBN: 1-4757-9027-9 |
 | | Scanning Electron Microscopy and X-Ray Microanalysis Third Edition by Patrick Echlin, Dale E. Newbury, Joseph I. Goldstein, Charles E. Lyman, David C. Joy, Eric Lifshin, Linda Sawyer, J.R. Michael 689 Pages, Published 2012 by Springer Science & Business Media ISBN-13: 978-1-4615-0215-9, ISBN: 1-4615-0215-2 |
 | | Scanning Electron Microscopy and X-Ray Microanalysis(Reprint) by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, David C. Joy Paperback, 550 Pages, Published 2018 by Springer ISBN-13: 978-1-4939-8269-1, ISBN: 1-4939-8269-9 |
 | | Principles of Analytical Electron Microscopy(Reprint) by Joseph Goldstein, David C. Joy Paperback, 468 Pages, Published 2013 by Springer ISBN-13: 978-1-4899-2039-3, ISBN: 1-4899-2039-0 |
 | | Introduction to Electron Holography(1st Edition) by Lawrence F. Allard, David C. Joy, Edgar Völkl, E. Voelkl, David Charles Joy, Edgar Vc6lkl, Edgar Vvlkl, Edgar Vlkl, Edgar Valkl Hardcover, 350 Pages, Published 1999 by Springer ISBN-13: 978-0-306-44920-8, ISBN: 0-306-44920-X |
David Joy