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Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists by Joseph Goldstein, Dale E. Newbury, Patrick Echlin Paperback, 692 Pages, Published 2013 by Springer ISBN-13: 978-1-4613-3274-9, ISBN: 1-4613-3274-5 |
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy(Reprint) A Laboratory Workbook by Charles E. Lyman, John Armstrong, Joseph Goldstein, Eric Lifshin, Patrick Echlin, Charles Fiori, Dale E. Newbury, David B. Williams, David C. Joy, Klaus-RĂ¼diger Peters, Klaus-Ruediger Peters Paperback, 407 Pages, Published 1990 by Springer ISBN-13: 978-0-306-43591-1, ISBN: 0-306-43591-8 |
Scanning Electron Microscopy and X-Ray Microanalysis(4th Edition) by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, David C. Joy, John Henry Scott Hardcover, 550 Pages, Published 2017 by Springer ISBN-13: 978-1-4939-6674-5, ISBN: 1-4939-6674-X |
X-Ray Spectrometry in Electron Beam Instruments(Reprint) by Joseph I. Goldstein, Dale E. Newbury, David B. Williams Paperback, 372 Pages, Published 2013 by Springer ISBN-13: 978-1-4613-5738-4, ISBN: 1-4613-5738-1 |
Scanning Electron Microscopy and X-Ray Microanalysis(2nd Edition) A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Patrick Echlin, Dale E. Newbury, David C. Joy, Charles E. Lyman, Charles Fiori, Eric Lifshin Paperback, 840 Pages, Published 2011 by Springer ISBN-13: 978-1-4612-7653-1, ISBN: 1-4612-7653-5 |
Scanning Electron Microscopy and X-ray Microanalysis(3rd Edition) Third Edition by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael, Joseph Michael, L.C. Sawyer Hardcover, 690 Pages, Published 2007 by Springer ISBN-13: 978-0-306-47292-3, ISBN: 0-306-47292-9 |
Scanning Electron Microscopy and X-Ray Microanalysis(1981st Edition) A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Patrick Echlin, Dale E. Newbury, David C. Joy, Charles Fiori, Eric Lifshin Paperback, 673 Pages, Published 2014 by Springer ISBN-13: 978-1-4613-3275-6, ISBN: 1-4613-3275-3 |
Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin, David C. Joy, Dale E. Newbury, Joseph I. Goldstein, Charles E. Fiori Hardcover, 454 Pages, Published 1986 by Plenum Press ISBN-13: 978-0-306-42140-2, ISBN: 0-306-42140-2 |
Scanning Electron Microscopy and X-Ray Microanalysis(2nd Edition) A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Patrick Echlin, Dale E. Newbury, David C. Joy, Charles Fiori, Eric Lifshin Hardcover, 673 Pages, Published 1981 by Springer ISBN-13: 978-0-306-40768-0, ISBN: 0-306-40768-X |
Scanning Electron Microscopy and X-ray Microanalysis(3rd Edition) Third Edition by Joseph Goldstein, David C. Joy, Dale E. Newbury, Patrick Echlin, Charles E., Eric Lifshin, J.R. Michael, Linda C. Sawyer, Dale E. Paperback, 689 Pages, Published 2013 by Springer ISBN-13: 978-1-4613-4969-3, ISBN: 1-4613-4969-9 |
X-Ray Spectrometry in Electron Beam Instruments by Joseph Goldstein, Dale E. Newbury, David B. Williams, David Bernard Williams Hardcover, 372 Pages, Published 1995 by Springer ISBN-13: 978-0-306-44858-4, ISBN: 0-306-44858-0 |
Scanning Electron Microscopy and X-Ray Microanalysis(Reprint) by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, David C. Joy Paperback, 550 Pages, Published 2018 by Springer ISBN-13: 978-1-4939-8269-1, ISBN: 1-4939-8269-9 |
Fundamental Electron and Ion Beam Interactions with Solids for Microscopy, Microanalysis and Microlithography Proceedings of The...held May 7-12, 1989, at Park City, Utah by Pieter Kruit, Dale E. Newbury, Jorgen Schou Hardcover, 370 Pages, Published 1990 by Scanning Microscopy International ISBN-13: 978-0-931288-46-3, ISBN: 0-931288-46-0 |
Advanced Scanning Electron Microscopy and X-Ray Microanalysis(Reprint) by Patrick Echlin, Joseph I. Goldstein, Charles E. Fiori, Dale E. Newbury, David C. Joy Paperback, 454 Pages, Published 2013 by Springer ISBN-13: 978-1-4757-9029-0, ISBN: 1-4757-9029-5 |
Scanning Electron Microscopy and X-Ray Microanalysis(2nd Edition) A Text for Biologists, Materials Scientists, and Geologists by Patrick Echlin, Dale E. Newbury, Joseph I. Goldstein, David C. Joy, Charles E. Lyman, Charles Fiori, Eric Lifshin Hardcover, 840 Pages, Published 1992 by Springer ISBN-13: 978-0-306-44175-2, ISBN: 0-306-44175-6 |
Scanning Microscopies 2015 (Proceedings of SPIE) by Michael T. Postek, Dale Newbury, S. Frank Platek, Timothy K. Maugel Paperback, 277 Pages, Published 2015 by Spie Press ISBN-13: 978-1-62841-846-0, ISBN: 1-62841-846-X |
Scanning Microscopies 2011 Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences by Michael T. Postek, David Joy, S. Frank Platek, Dale Newbury, Tim Maugel Paperback, 254 Pages, Published 2011 by Spie Press ISBN-13: 978-0-8194-8610-3, ISBN: 0-8194-8610-8 |
Scanning Microscopies 2014 16-18 September 2014, Monterey, California, United States (Proceedings of SPIE) by Michael T. Postek, Dale Newbury, S. Frank Platek, Timothy K. Maugel Paperback, 277 Pages, Published 2014 by Spie Press ISBN-13: 978-1-62841-299-4, ISBN: 1-62841-299-2 |
Scanning Microscopie 2013 Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences (Proceedings of SPIE) by Dale Newbury, S. Frank Platek, Michael T. Postek, Timothy K. Maugel Paperback, 277 Pages, Published 2013 by Spie Press ISBN-13: 978-0-8194-9520-4, ISBN: 0-8194-9520-4 |
Scanning Electron Microscopy and X-ray Microanalysis by Dale E. Newbury , David C. Joy , Joseph Goldstein , Joseph I. Goldstein Paperback, 720 Pages, Published 2003 by Springer My Copy Uk ISBN-13: 978-1-4615-0216-6, ISBN: 1-4615-0216-0 |
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